Design for test (DFT)

I am doing research in two DFT related fields:

    - RTL ATPG and

    - Single Cycle Access structures for testing.


In RTL ATPG we derive stuck-at patterns from RTL. With my proposed "
Gate Inherent Faults" solution, you are able to generate 100% stuck-at coverage on gate level with pattern solely generated on RTL for the first time. The following paper covers this:

T.Strauch, "A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates"
, Cornell University Library, 15th December 2016,

Single Cycle Access Structures

Single Cycle Access Structures - or better known as "Random Access Structures" replace the classical scan based approach with a more memory like single cycle read and write access to individual register lines. In this paper I argue, that my proposed solution can be seen as a reasonable alternative to existing methods:

T.Strauch, "Single Cycle Access Structure for Logic Test", IEEE Transactions on VLSI, vol. 20, no. 5, May 2012, pp. 878-891,

last modified: 2017/Sep/15